• DocumentCode
    1327521
  • Title

    Capacitive coupling and quantized feedback applied to conventional CMOS technology

  • Author

    Gabara, Thaddeus J. ; Fischer, Wilhelm C.

  • Author_Institution
    Bell Labs., Lucent Technol., Murray Hill, NJ, USA
  • Volume
    32
  • Issue
    3
  • fYear
    1997
  • fDate
    3/1/1997 12:00:00 AM
  • Firstpage
    419
  • Lastpage
    427
  • Abstract
    An on-chip capacitor is formed under the bond pad to block the DC level of input signals. Capacitively coupled signals suffer the “zero wander” effect which causes the local DC level on the second plate of the capacitor to be dependent on the bit activity rate. A quantized feedback technique using a self-triggered decision circuit is used to reestablish local DC voltage levels in the receiver and eliminates the “zero wander” effect. The input signals can be detected over a large common mode range independent of the bit activity rate and over a large frequency range. Silicon area and power dissipation are reduced since encoding and decoding of the bit stream is not required. The circuit has been implemented in silicon using a conventional digital 0.5 μm CMOS technology. This receiver can detect a 231-1 pseudorandom pattern at 800 Mb/s with no errors and can operate down to a data rate of 2 kHz
  • Keywords
    CMOS digital integrated circuits; capacitance; circuit feedback; coupled circuits; decision circuits; integrated circuit technology; receivers; 0.5 micron; 800 Mbit/s; DC level blocking; bit activity rate; bond pad; capacitive coupling; conventional CMOS technology; digital submicron CMOS technology; local DC voltage levels; onchip capacitor; pseudorandom pattern detection; quantized feedback; quantized feedback technique; receiver; self-triggered decision circuit; zero wander effect elimination; Bonding; CMOS technology; Capacitors; Coupling circuits; Feedback circuits; Frequency; Power dissipation; Signal detection; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.557640
  • Filename
    557640