• DocumentCode
    1327965
  • Title

    Silicon carbide JFET reverse conduction characteristics and use in power converters

  • Author

    Shillington, R. ; Gaynor, Paul ; Harrison, Michael ; Heffernan, W.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Canterbury, Christchurch, New Zealand
  • Volume
    5
  • Issue
    8
  • fYear
    2012
  • fDate
    9/1/2012 12:00:00 AM
  • Firstpage
    1282
  • Lastpage
    1290
  • Abstract
    Recent advances have resulted in the availability of a new generation of silicon carbide (SiC) junction field effect transistors (JFETs), which unlike previous generations, exhibit highly desirable normally off characteristics. Normally off SiC JFETs are characterised with particular focus on previously unknown reverse conduction characteristics. Refinements are proposed to JFET gate driving circuits that allow their implementation as a single-chip solution. Reverse recovery characteristics of SiC JFETs were measured using diode testing techniques and found to be significantly faster than typical silicon metal oxide semi-conductor field effect transistor (MOSFET) body diodes. SiC JFETs are compared with silicon MOSFETs in power factor correction boost converters, including a real-world application where superior power conversion efficiency utilising SiC JFETs is demonstrated.
  • Keywords
    MOSFET; junction gate field effect transistors; power convertors; power factor correction; MOSFET; SiC; diode testing techniques; junction field effect transistors; power factor correction boost converters; reverse recovery characteristics; silicon carbide JFET reverse conduction characteristics; silicon metal oxide semi-conductor field effect transistor; single-chip solution;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IET
  • Publisher
    iet
  • ISSN
    1755-4535
  • Type

    jour

  • DOI
    10.1049/iet-pel.2011.0404
  • Filename
    6340661