DocumentCode
1328136
Title
Breakdown of magnetic insulation in semiconductor plasmas
Author
Papadopoulos, K. ; Zigler, A. ; Book, D.L. ; Cohen, C. ; Hashimshony, D.
Author_Institution
Adv. Power Technol. Inc., Washington, DC, USA
Volume
24
Issue
3
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
1095
Lastpage
1100
Abstract
A theoretical analysis of the current response of strongly magnetized electrically biased photoconductors to short laser pulses, with emphasis on the breakdown of magnetic insulation, is presented. There are two regimes that result in breaking of the magnetic insulation during the “on” time of the pulse: (1) the collisionless regime, applicable to pulses with duration τ0<1/ν, where ν is the collision frequency, in which the magnetic insulation is broken by a polarization-like current induced by the fast rate of increase of the carriers, and (2) the collisional regime, applicable to pulses with τ0>1/ν, where the magnetic insulation is broken at high carrier density due to the nonlinear dependence of the collision frequency on the carrier density. A simple experiment was performed which confirms the physics of the collisional regime. It is shown that the presence of the magnetic field can significantly reduce the response time of photoconductors. Response times shorter than a picosecond can be achieved in the collisionless regime
Keywords
electric breakdown; insulation; photoconducting materials; semiconductor plasma; carrier density; collision frequency; collisional regime; collisionless regime; current response; high carrier density; magnetic field; magnetic insulation breakdown; nonlinear dependence; polarization-like current; semiconductor plasmas; short laser pulses; strongly magnetized electrically biased photoconductors; Charge carrier density; Delay; Electric breakdown; Frequency; Insulation; Magnetic analysis; Magnetic semiconductors; Photoconductivity; Plasmas; Semiconductor device breakdown;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.533117
Filename
533117
Link To Document