DocumentCode :
1328136
Title :
Breakdown of magnetic insulation in semiconductor plasmas
Author :
Papadopoulos, K. ; Zigler, A. ; Book, D.L. ; Cohen, C. ; Hashimshony, D.
Author_Institution :
Adv. Power Technol. Inc., Washington, DC, USA
Volume :
24
Issue :
3
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
1095
Lastpage :
1100
Abstract :
A theoretical analysis of the current response of strongly magnetized electrically biased photoconductors to short laser pulses, with emphasis on the breakdown of magnetic insulation, is presented. There are two regimes that result in breaking of the magnetic insulation during the “on” time of the pulse: (1) the collisionless regime, applicable to pulses with duration τ0<1/ν, where ν is the collision frequency, in which the magnetic insulation is broken by a polarization-like current induced by the fast rate of increase of the carriers, and (2) the collisional regime, applicable to pulses with τ0>1/ν, where the magnetic insulation is broken at high carrier density due to the nonlinear dependence of the collision frequency on the carrier density. A simple experiment was performed which confirms the physics of the collisional regime. It is shown that the presence of the magnetic field can significantly reduce the response time of photoconductors. Response times shorter than a picosecond can be achieved in the collisionless regime
Keywords :
electric breakdown; insulation; photoconducting materials; semiconductor plasma; carrier density; collision frequency; collisional regime; collisionless regime; current response; high carrier density; magnetic field; magnetic insulation breakdown; nonlinear dependence; polarization-like current; semiconductor plasmas; short laser pulses; strongly magnetized electrically biased photoconductors; Charge carrier density; Delay; Electric breakdown; Frequency; Insulation; Magnetic analysis; Magnetic semiconductors; Photoconductivity; Plasmas; Semiconductor device breakdown;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.533117
Filename :
533117
Link To Document :
بازگشت