DocumentCode :
132816
Title :
Possible alternatives to overcoming speed limitations using synthetic instruments signal analysis architecture
Author :
Stratton, John
Author_Institution :
Keysight Technol., Santa Rosa, CA, USA
fYear :
2014
fDate :
15-18 Sept. 2014
Firstpage :
150
Lastpage :
152
Abstract :
Signal Analyzers have been widely used in automatic test equipment (ATE) since the first computer controlled Spectrum analyzer introduced by Hewlett Packard (now Agilent) back in 1978. These signal analyzers are widely used to find signals in the frequency domain whether wanted or unwanted (spurious signals). One of the largest issues with signal analyzers are their ability to create additional signals, internally, which pretend to be real signals on their display. This may be misleading and cause the operator to spend hours, if not days, troubleshooting a problem with their device. Because of these unintentional signals, instrument manufacturers have developed a number of architectures that would minimize the unwanted signals without suppressing the signals that are the target of the measurement. With the advent of the synthetic instrument (SI) architecture, signal analyzers have taken advantage of new Analog-to-Digital Converters (ADC) and faster computers (Signal Processors) to identify signals, faster and with greater fidelity. However, even with these latest SI instruments they still take longer to measure small, unknown, spurious signals over wide spans and older, traditional, spectrum analyzers. This would not be a problem if it were not the longest measurement in the test suite. Low level spur searched can take from milliseconds to several minutes to even hours if a wide span needs to be searched with traditional spectrum analyzers. With an SI signal it could be 2 to 20 time slower making it unusable in an ATE environment. This paper will explore different signal analyzer architectures and the benefits and limitations of each. This paper will also explore how a signal analyzer processes a measurement and how engineers can deduce the time of measuring low levels spurs in each of these processes. And finally, this paper will show potential ways a synthetic architecture can improve the spur searching capability over the traditional spectrum analyzers yielding - mproved productivity in ATE applications.
Keywords :
automatic test equipment; level measurement; spectral analysers; ADC; ATE; Agilent; Hewlett Packard; SI architecture; analog-to-digital converter; automatic test equipment; frequency domain analysis; low level spur measurement; signal analyzer; signal measurement; signal processor; spectrum analyzer; synthetic instrument signal analysis architecture; unwanted spurious signal; wanted spurious signal; Bandwidth; Computer architecture; Computers; Digital signal processing; Frequency conversion; Instruments; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2014 IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4799-3389-1
Type :
conf
DOI :
10.1109/AUTEST.2014.6935136
Filename :
6935136
Link To Document :
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