• DocumentCode
    1328253
  • Title

    A (64,45) Triple Error Correction Code for Memory Applications

  • Author

    Reviriego, Pedro ; Flanagan, Mark ; Maestro, Juan Antonio

  • Author_Institution
    Univ. Antonio de Nebrija, Madrid, Spain
  • Volume
    12
  • Issue
    1
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    101
  • Lastpage
    106
  • Abstract
    Memories are commonly protected with error correction codes to avoid data corruption when a soft error occurs. Traditionally, per-word single error correction (SEC) codes are used. This is because they are simple to implement and provide low latency. More advanced codes have been considered, but their main drawback is the complexity of the decoders and the added latency. Recently, the use of one-step majority logic decodable codes has been proposed for memory protection. One-step majority logic decoding enables the use of low-complexity decoders, and low latency can also be achieved with moderate complexity. The main issue is that there are only a few codes that are one-step majority logic decodable. This restricts the choice of word lengths and error correction capabilities. In this paper, a method to derive new codes from a class of one-step majority logic decodable codes known as difference-set codes is proposed. The derived codes can also be efficiently implemented. As an example, a (64,45) triple error correction (TEC) code is derived and compared with existing SEC and TEC codes. The results presented enable a wider choice of word lengths and error correction capabilities that will be useful for memory designs.
  • Keywords
    decoding; digital storage; error correction codes; TEC codes; data corruption; decoder complexity; difference-set codes; memory designs; memory protection; one-step majority logic decodable codes; one-step majority-logic decoding; per-word SEC codes; per-word single-error correction codes; soft error; triple-error correction code; word lengths; Complexity theory; Decoding; Equations; Error correction codes; Iterative decoding; Logic gates; Mathematical model; Difference-set codes; error correction codes (ECCs); majority logic decoding; memory;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2011.2169413
  • Filename
    6026914