DocumentCode
1328253
Title
A (64,45) Triple Error Correction Code for Memory Applications
Author
Reviriego, Pedro ; Flanagan, Mark ; Maestro, Juan Antonio
Author_Institution
Univ. Antonio de Nebrija, Madrid, Spain
Volume
12
Issue
1
fYear
2012
fDate
3/1/2012 12:00:00 AM
Firstpage
101
Lastpage
106
Abstract
Memories are commonly protected with error correction codes to avoid data corruption when a soft error occurs. Traditionally, per-word single error correction (SEC) codes are used. This is because they are simple to implement and provide low latency. More advanced codes have been considered, but their main drawback is the complexity of the decoders and the added latency. Recently, the use of one-step majority logic decodable codes has been proposed for memory protection. One-step majority logic decoding enables the use of low-complexity decoders, and low latency can also be achieved with moderate complexity. The main issue is that there are only a few codes that are one-step majority logic decodable. This restricts the choice of word lengths and error correction capabilities. In this paper, a method to derive new codes from a class of one-step majority logic decodable codes known as difference-set codes is proposed. The derived codes can also be efficiently implemented. As an example, a (64,45) triple error correction (TEC) code is derived and compared with existing SEC and TEC codes. The results presented enable a wider choice of word lengths and error correction capabilities that will be useful for memory designs.
Keywords
decoding; digital storage; error correction codes; TEC codes; data corruption; decoder complexity; difference-set codes; memory designs; memory protection; one-step majority logic decodable codes; one-step majority-logic decoding; per-word SEC codes; per-word single-error correction codes; soft error; triple-error correction code; word lengths; Complexity theory; Decoding; Equations; Error correction codes; Iterative decoding; Logic gates; Mathematical model; Difference-set codes; error correction codes (ECCs); majority logic decoding; memory;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2011.2169413
Filename
6026914
Link To Document