• DocumentCode
    1328272
  • Title

    Nanoscale Bipolar and Complementary Resistive Switching Memory Based on Amorphous Carbon

  • Author

    Chai, Yang ; Wu, Yi ; Takei, Kuniharu ; Chen, Hong-Yu ; Yu, Shimeng ; Chan, Philip C.H. ; Javey, Ali ; Wong, H. -S Philip

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • Volume
    58
  • Issue
    11
  • fYear
    2011
  • Firstpage
    3933
  • Lastpage
    3939
  • Abstract
    There has been a strong demand for developing an ultradense and low-power nonvolatile memory technology. In this paper, we present a carbon-based resistive random access memory device with a carbon nanotube (CNT) electrode. An amorphous carbon layer is sandwiched between the fast-diffusing top metal electrode and the bottom CNT electrode, exhibiting a bipolar switching behavior. The use of the CNT electrode can substantially reduce the size of the active device area. We also demonstrate a carbon-based complementary resistive switch (CRS) consisting of two back-to-back connected memory cells, providing a route to reduce the sneak current in the cross-point memory. The bit information of the CRS cell is stored in a high-resistance state, thus reducing the power consumption of the CRS memory cell. This paper provides valuable early data on the effect of electrode size scaling down to nanometer size.
  • Keywords
    amorphous semiconductors; bipolar memory circuits; carbon nanotubes; low-power electronics; nanotube devices; random-access storage; CRS cell; CRS memory cell; active device area; amorphous carbon layer; back-to-back connected memory cells; bipolar switching behavior; bottom CNT electrode; carbon nanotube electrode; carbon-based complementary resistive switch; carbon-based resistive random access memory device; cross-point memory; electrode size; fast-diffusing top metal electrode; high-resistance state; low-power nonvolatile memory technology; nanometer size; nanoscale bipolar resistive switching memory; nanoscale complementary resistive switching memory; power consumption; sneak current; ultradense nonvolatile memory technology; Carbon; Electrodes; Gold; Nanoscale devices; Resistance; Switches; Amorphous carbon (a-C); carbon nanotube (CNT); complementary resistive switching; nonvolatile memory; resistive random access memory (RRAM); resistive switching memory;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2164615
  • Filename
    6026917