Title :
IEEE P1505.3™ universal test interface framework and pin configuration for portable/bench top test requirements utilizing IEEE 1505 receiver fixture interface standard
Author :
Stora, Michael ; Mann, Sebastian ; Spinner, Rob ; Droste, David ; Isabella, George
Author_Institution :
I&M Soc. A/I TC-8, IEEE, Riverdale, NJ, USA
Abstract :
This Standard defines a Universal Test Interface (UTI) Pin Map Configuration for portable and bench top test requirements utilizing IEEE Std 1505, which will provide an open architecture serving the general electronic test industry. The UTI standard will permit users to create low-cost COTS interface solution and migrate test fixtures (i.e. adapters, interface devices,etc.), transparently between UTI configured test systems.
Keywords :
IEEE standards; automatic test equipment; portable instruments; ATE; IEEE 1505 receiver fixture interface standard; IEEE P1505.3 universal test interface framework; UTI; general electronic test industry; low-cost COTS interface solution; pin map configuration; portable-bench top test requirement; test fixture migration; Capacitance; Connectors; Contacts; Force; Receivers; Reliability; Silicon; ATE; ATS; Fixture; ICD; ITA; Interface; Mass Interconnect; Receiver; Scalable; TPS; UUT;
Conference_Titel :
AUTOTESTCON, 2014 IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4799-3389-1
DOI :
10.1109/AUTEST.2014.6935144
