DocumentCode
1328375
Title
A 33-Megapixel 120-Frames-Per-Second 2.5-Watt CMOS Image Sensor With Column-Parallel Two-Stage Cyclic Analog-to-Digital Converters
Author
Kitamura, Kazuya ; Watabe, Toshihisa ; Sawamoto, Takehide ; Kosugi, Tomohiko ; Akahori, Tomoyuki ; Iida, Tetsuya ; Isobe, Keigo ; Watanabe, Takashi ; Shimamoto, Hiroshi ; Ohtake, Hiroshi ; Aoyama, Satoshi ; Kawahito, Shoji ; Egami, Norifumi
Volume
59
Issue
12
fYear
2012
Firstpage
3426
Lastpage
3433
Abstract
A 33-megapixel 120-frames/s (fps) CMOS image sensor has been developed. The 7808 × 4336 pixel 2.8-μm pixel pitch CMOS image sensor with 12-bit, column-parallel, two-stage, cyclic analog-to-digital converters (ADCs) and 96 parallel low-voltage differential signaling output ports operates at a data rate of 51.2 Gb/s. The pipelined operation of the two cyclic ADCs reduces the conversion time. This ADC architecture also effectively lowers the power consumption by exploiting the amplifier function of the cyclic ADC. The CMOS image sensor implemented with 0.18-μm technology exhibits a sensitivity of 0.76 V/lx·s without a microlens and a random noise of 5.1 erms- with no column amplifier gain and 3.0erms- with a gain of 7.5 at 120 fps while dissipating only 2.45 and 2.67 W, respectively.
Keywords
CMOS image sensors; amplifiers; analogue-digital conversion; random noise; ADC architecture; amplifier function; bit rate 51.2 Gbit/s; column-parallel two-stage cyclic analog-to-digital converters; parallel low-voltage differential signaling output ports; picture size 33 Mpixel; pixel pitch CMOS image sensor; power 2.5 W; power consumption; random noise; size 0.18 mum; word length 12 bit; CMOS image sensors; Capacitors; Image resolution; Noise measurement; Power demand; Analog–digital conversion; CMOS image sensors; high-definition video; high-resolution imaging;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2220364
Filename
6341066
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