• DocumentCode
    1328382
  • Title

    Spatial Composition Grading of Binary Metal Alloy Gate Electrode for Short-Channel SOI/SON MOSFET Application

  • Author

    Manna, Bibhas ; Sarkhel, Saheli ; Islam, Nurul ; Sarkar, S. ; Sarkar, Subir Kumar

  • Author_Institution
    Dept. of Electron. & Telecommun. Eng., Jadavpur Univ., Kolkata, India
  • Volume
    59
  • Issue
    12
  • fYear
    2012
  • Firstpage
    3280
  • Lastpage
    3287
  • Abstract
    An overall performance comparison analysis based on 2-D Poisson´s equation solution has been presented here both for silicon-on-insulator (SOI) and silicon-on-nothing (SON) MOSFET structures. In this paper, for the first time, an idea of work function engineering with continuous horizontal mole fraction variation in a binary alloy gate has been proposed and implemented analytically to reduce rolloff in threshold voltage for SON MOSFET, thereby improving its performance over single-gate SON structures. Analytical model-based simulation verified that SON is superior over SOI MOSFET due to its higher immunity to different short-channel effects and increased current driving capability. Our results are found to be in good agreement with simulation results, thereby verifying the accuracy of the proposed analytical model.
  • Keywords
    MOSFET; Poisson equation; silicon; silicon-on-insulator; 2D Poisson equation solution; binary metal alloy gate electrode; continuous horizontal mole fraction variation; current driving capability; short-channel SOI-SON MOSFET application; silicon-on-insulator; silicon-on-nothing; spatial composition grading; Electric potential; Electrodes; Logic gates; MOSFET circuits; Poisson equations; Silicon; Threshold voltage; Drain-induced barrier lowering (DIBL); silicon-on-insulator (SOI)/silicon-on-nothing (SON) MOSFET; subthreshold slope; threshold voltage rolloff; work function engineering;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2220143
  • Filename
    6341067