DocumentCode
1328382
Title
Spatial Composition Grading of Binary Metal Alloy Gate Electrode for Short-Channel SOI/SON MOSFET Application
Author
Manna, Bibhas ; Sarkhel, Saheli ; Islam, Nurul ; Sarkar, S. ; Sarkar, Subir Kumar
Author_Institution
Dept. of Electron. & Telecommun. Eng., Jadavpur Univ., Kolkata, India
Volume
59
Issue
12
fYear
2012
Firstpage
3280
Lastpage
3287
Abstract
An overall performance comparison analysis based on 2-D Poisson´s equation solution has been presented here both for silicon-on-insulator (SOI) and silicon-on-nothing (SON) MOSFET structures. In this paper, for the first time, an idea of work function engineering with continuous horizontal mole fraction variation in a binary alloy gate has been proposed and implemented analytically to reduce rolloff in threshold voltage for SON MOSFET, thereby improving its performance over single-gate SON structures. Analytical model-based simulation verified that SON is superior over SOI MOSFET due to its higher immunity to different short-channel effects and increased current driving capability. Our results are found to be in good agreement with simulation results, thereby verifying the accuracy of the proposed analytical model.
Keywords
MOSFET; Poisson equation; silicon; silicon-on-insulator; 2D Poisson equation solution; binary metal alloy gate electrode; continuous horizontal mole fraction variation; current driving capability; short-channel SOI-SON MOSFET application; silicon-on-insulator; silicon-on-nothing; spatial composition grading; Electric potential; Electrodes; Logic gates; MOSFET circuits; Poisson equations; Silicon; Threshold voltage; Drain-induced barrier lowering (DIBL); silicon-on-insulator (SOI)/silicon-on-nothing (SON) MOSFET; subthreshold slope; threshold voltage rolloff; work function engineering;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2220143
Filename
6341067
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