• DocumentCode
    1328410
  • Title

    Estimation of Photovoltaic System Reliability and Performance Metrics

  • Author

    Dhople, Sairaj V. ; Domínguez-García, Alejandro D.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • Volume
    27
  • Issue
    1
  • fYear
    2012
  • Firstpage
    554
  • Lastpage
    563
  • Abstract
    A framework to integrate reliability and performance analysis of grid-tied photovoltaic (PV) systems is formulated using Markov reward models (MRM). The framework allows the computation of performance metrics such as capacity and energy yield, and reliability metrics such as availability. The paper also provides an analytical method to compute the sensitivity of performance metrics to MRM-parameter variations. The approach to sensitivity analysis is demonstrated to be particularly useful to formulate optimal operational policies, e.g., repair strategies, as the impact of variations in model parameters on system performance can be rapidly evaluated. Case studies demonstrate several applications of the proposed framework, including analysis of residential and large utility-level installations, and emerging distributed inverter architectures.
  • Keywords
    Markov processes; government policies; photovoltaic power systems; power generation reliability; power grids; sensitivity analysis; MRM; MRM-parameter variation; Markov reward model; distributed inverter architecture; grid-tied PV system; grid-tied photovoltaic system; large utility-level installation; optimal operational policy; performance metric computation; photovoltaic system reliability estimation; reliability metric; sensitivity analysis; Analytical models; Biological system modeling; Maintenance engineering; Markov processes; Measurement; Power system reliability; Reliability; Generalized matrix inversion; Markov reward models; photovoltaics; reliability; sensitivity analysis;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/TPWRS.2011.2165088
  • Filename
    6026939