Title :
A Low-Power Compressive Sampling Time-Based Analog-to-Digital Converter
Author :
Yenduri, Praveen K. ; Rocca, Aaron Z. ; Rao, Aswin S. ; Naraghi, Shahrzad ; Flynn, Michael P. ; Gilbert, Anna C.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
This paper presents a low-power, time-based, compressive sampling architecture for analog-to-digital conversion. A random pulse-position-modulation (PPM) analog-to-digital conversion (ADC) architecture is proposed. A prototype 9-bit random PPM ADC incorporating a pseudo-random sampling scheme is implemented as proof of concept. This approach leverages the energy efficiency of time-based processing. The use of sampling techniques that exploit signal compressibility leads to further improvements in efficiency. The random PPM (pulse-position-modulation) ADC employs compressive sampling techniques to efficiently sample at sub-Nyquist rates. The sub-sampled signal is recovered using a reconstruction algorithm, which is tailored for practical hardware implementation. We develop a theoretical analysis of the hardware architecture and the reconstruction algorithm. Measurements of a prototype random PPM ADC and simulation, demonstrate this theory. The prototype successfully demonstrates a 90% reduction in sampling rate compared to the Nyquist rate for input signals that are 3% sparse in frequency domain.
Keywords :
analogue-digital conversion; pulse position modulation; sampling methods; signal reconstruction; energy efficiency; low-power compressive sampling time-based analog-to-digital converter; pseudo-random sampling; pulse-position modulation; random PPM ADC; signal compressibility; signal reconstruction; signal recovery; word length 9 bit; Algorithm design and analysis; Analog-digital conversion; Converters; Hardware; Sparse matrices; Synchronization; Analog-to-digital conversion (ADC); compressive sampling (CS); low-power ADC; time-based ADC; time-to-digital converters;
Journal_Title :
Emerging and Selected Topics in Circuits and Systems, IEEE Journal on
DOI :
10.1109/JETCAS.2012.2221832