DocumentCode :
132854
Title :
Using temporal causal models to isolate failures in Power System protection devices
Author :
Mahadevan, Nagabhushan ; Dubey, Anamika ; Huangcheng Guo ; Karsai, Gabor
Author_Institution :
Inst. for Software-Integrated Syst., Vanderbilt Univ., Nashville, TN, USA
fYear :
2014
fDate :
15-18 Sept. 2014
Firstpage :
270
Lastpage :
279
Abstract :
Power transmission systems are instrumented with a network of fast-acting protection devices that detect anomalies and arrest the fault propagation, thereby isolating the faulty components to protect the remaining system. However, often a local protection action leads to cascading effects to other regions resulting in blackouts. Also, inherent faults in protection devices such as relays and breakers could lead to failed or misguided protection action. A fault model associated with such a system needs to capture the dynamic behavior of the system as well as protection scheme in both nominal and faulty modes of operation. With an effort to capture the temporal behavior and the fault propagation of the system and its autonomous protection mechanism, we propose a new modeling formalism - the Temporal Causal Diagram (TCD). In this paper, we will describe the TCD modeling formalism and apply it to create fault-models that capture the fault propagation and state evolution of the Power Systems and their autonomous protection units. Further, we showcase simulation models derived from the TCD models and use these to simulate single and multi-fault scenarios in power transmission systems.
Keywords :
power transmission faults; power transmission protection; TCD modeling formalism; anomaly detection; autonomous protection units; dynamic behavior; failure isolation; fault propagation; local protection action; multifault scenarios; nominal modes; power system protection devices; power transmission systems; single fault scenarios; state evolution; temporal behavior; temporal causal diagram; Circuit faults; Impedance; Power transmission lines; Protective relaying;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2014 IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4799-3389-1
Type :
conf
DOI :
10.1109/AUTEST.2014.6935156
Filename :
6935156
Link To Document :
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