Title :
Reply to Comments on "A Causal Redefinition of Failure RateߞTheorems, Stress Dependence, and Application to Devices and Distributions"
Author :
Stewart, Robert G.
Author_Institution :
Lockheed Palo Alto Research Lab., Palo Alto, Calif.
Keywords :
Assembly systems; Degradation; Electrons; Hazards; Reliability theory; Shape; Stress; Testing; Weibull distribution;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1967.5217483
