Title :
Device Failures During Equipment Life for Lognormal Distributions
Author :
Ansley, William G.
Author_Institution :
Hewlett-Packard Labs., Palo Alto, Calif.
Abstract :
A simple graph is presented showing the total fraction of devices which will fail over any given time for lognormal failure distributions. The result is a function of the median life and the geometric dispersion.
Keywords :
Equations; Failure analysis; Gaussian distribution; Reliability; Tellurium; Uncertainty;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1967.5217489
