DocumentCode
1328708
Title
Device Failures During Equipment Life for Lognormal Distributions
Author
Ansley, William G.
Author_Institution
Hewlett-Packard Labs., Palo Alto, Calif.
Issue
3
fYear
1967
Firstpage
139
Lastpage
140
Abstract
A simple graph is presented showing the total fraction of devices which will fail over any given time for lognormal failure distributions. The result is a function of the median life and the geometric dispersion.
Keywords
Equations; Failure analysis; Gaussian distribution; Reliability; Tellurium; Uncertainty;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1967.5217489
Filename
5217489
Link To Document