Title :
The research on the design and application of a new configurable test instrument
Author :
Yonghui Xu ; Jihui Zhang ; Xiaodong Liu
Author_Institution :
Dept. of Autom. Test & Control, Harbin Inst. of Technol., Harbin, China
Abstract :
To meet the needs of the generalization and miniaturization of the automatic testing system, a new configurable test instrument was designed. The module had 32 input channels and 8 output channels. Each of the 32 channels could be configured as an analog measurement, digital measurement, frequency measurement or DMM; and each of the 8 output channels could be configured as a DC output or arbitrary waveform generator. The pin function of the module was configurable and its scale was especially wide. It could substitute the resource distribution function and signal conditioning function of the test unit adapter, which can effectively compress the volume and enhance the generality of the testing system. The test results showed that the design was reasonable and met the real requirement.
Keywords :
automatic test equipment; digital multimeters; frequency measurement; signal conditioning circuits; statistical distributions; waveform generators; DMM; analog measurement; arbitrary waveform generator; automatic testing system; configurable test instrument; digital measurement; frequency measurement; generalization; miniaturization; pin function; resource distribution function; signal conditioning function; test unit adapter; Digital signal processing; Field programmable gate arrays; Frequency measurement; Instruments; Multiplexing; Radiation detectors; Testing; Analog Input/Output; PXIbus; Pin functions configurable;
Conference_Titel :
AUTOTESTCON, 2014 IEEE
Conference_Location :
St. Louis, MO
Print_ISBN :
978-1-4799-3389-1
DOI :
10.1109/AUTEST.2014.6935168