• DocumentCode
    1328907
  • Title

    Scanning Magnetoresistance Microscopy Analysis of Bit Patterned Media Playback

  • Author

    Long Chang ; Veerdonk, Rene Vande ; Khizroev, S. ; Litvinov, Dmtri

  • Author_Institution
    Electr. & Comput. Eng, Univ. of Houston, Houston, TX, USA
  • Volume
    47
  • Issue
    10
  • fYear
    2011
  • Firstpage
    2548
  • Lastpage
    2550
  • Abstract
    A scanning magnetoresistance microscope (SMRM) was used to enable recording experiments on bit patterned media prototypes not yet suitable for spin-stand evaluation. The SMRM generates a 2D playback response of the media by “dragging” a recording head across the sample using a piezoelectric nanopositioner. A large-scale parameter optimization technique is applied to extract relevant parameters such as pulse amplitude, pulse width, and pulse position from the 2D playback response. The parameters were analyzed to learn that the pulse response of our recording head cannot be accurately modeled as a Gaussian function. The error in the optimized parameters is dominated by intertrack interference and to a lesser extent measurement resolution and thermal drift.
  • Keywords
    magnetic heads; magnetic recording; magnetoresistive devices; nanomagnetics; nanopositioning; piezoelectric devices; scanning electron microscopy; Gaussian function; bit patterned media playback; intertrack interference; large-scale parameter optimization technique; piezoelectric nanopositioner; pulse amplitude; pulse position; pulse width; recording head; resolution measurement; scanning magnetoresistance microscopy analysis; spin-stand evaluation; thermal drift; Magnetic heads; Magnetic recording; Magnetostatics; Media; Optimization; Saturation magnetization; Scanning electron microscopy; Magnetic recording; metrology; patterned media;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2153836
  • Filename
    6027565