Methodology for switching characterization evaluation of wide band-gap devices in a phase-leg configuration

Double pulse tester (DPT) is a widely accepted method to evaluate the switching behavior of power devices. Considering the high switching-speed capability of wide band-gap (WBG) devices, the test results become significantly sensitive to the alignment of voltage and current (V-I) measurement. Also, because of the shoot-through current induced by Cdv/dt, during the switching transient of one device, the switching losses of its complementary device in the phase-leg is non-negligible. This paper summarizes the key issues of DPT, including layout design, measurement considerations, grounding effects and data processing. Among them, the latest probes for switching waveform measurement are compared, the methods of V-I alignment are discussed, and the impact of grounding effects induced by probes on switching waveforms are investigated. Also, for the WBG devices in a phase-leg configuration, a practical method is proposed for switching loss evaluation by calculating the difference between the input energy supplied by a dc capacitor and the output energy stored in a load inductor. Based on a phase-leg power module built with 1200 V SiC MOSFETs, the test results show that regardless of V-I timing alignment, this method can accurately indicate the switching losses of both the upper and lower switches by detecting only one switching current.