DocumentCode :
1329903
Title :
Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs
Author :
Chien, Wei-Ting Kary ; Li, Miqing
Author_Institution :
Semiconductor Manufacturing International Corporation, Shanghai, China
Volume :
61
Issue :
4
fYear :
2012
Firstpage :
837
Lastpage :
845
Abstract :
Yield and reliability susceptibility would become obvious with the increase in the complexity of manufacturing technology. Yield and reliability enhancement is always our pursuit. However, tradeoffs between yield and reliability, or between Fab and assembly house, are often observed during the technology development (TD) phase, which will lengthen the production ramp-up period, and further affect the product profit. To shorten the time-to-market of a new technology, some practical experiences on solving tradeoffs in semiconductor manufacturing are reported; a generic procedure to handle the tradeoff problem is proposed, and the effectiveness was also proved. Early detection capability, baseline knowledge management, fully understanding customers´ requirements, and effectively consolidating all parties´ efforts are considered to play key roles in the procedure. It is believed that such a procedure can be also applied to solve the tradeoff problem in other industries.
Keywords :
Integrated circuits; Knowledge management; Time to market; Baseline; early detection; integrated circuit; knowledge management; reliability; time-to-market; tradeoff; yield;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2012.2222471
Filename :
6343242
Link To Document :
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