• DocumentCode
    1330215
  • Title

    Prolog to Parameter Variation Tolerance and Error Resiliency: New Design Paradigm for the Nanoscale Era

  • Author

    Donnell, Richard O.

  • Volume
    98
  • Issue
    10
  • fYear
    2010
  • Firstpage
    1716
  • Lastpage
    1717
  • Abstract
    Prolog to "Parameter Variation Tolerance and Error Resiliency: New Design Paradigm for the Nanoscale Era."
  • Keywords
    Integrated circuit design; Integrated circuit reliability; Integrated memory circuits; Logic circuits; Transistors;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2010.2060255
  • Filename
    5580239
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1330215