Title :
Prolog to Parameter Variation Tolerance and Error Resiliency: New Design Paradigm for the Nanoscale Era
Author :
Donnell, Richard O.
Abstract :
Prolog to "Parameter Variation Tolerance and Error Resiliency: New Design Paradigm for the Nanoscale Era."
Keywords :
Integrated circuit design; Integrated circuit reliability; Integrated memory circuits; Logic circuits; Transistors;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.2010.2060255
