• DocumentCode
    133087
  • Title

    Modeling and analysis of resonant switched capacitor converters with free-wheeling ZCS

  • Author

    Hamo, Eli ; Evzelman, Michael ; Peretz, Mor Mordechai

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
  • fYear
    2014
  • fDate
    16-20 March 2014
  • Firstpage
    2913
  • Lastpage
    2918
  • Abstract
    This paper introduces a unified modeling methodology to describe and explore the loss mechanism of resonant Switched Capacitor Converter (SCC) operating in a self-commutation zero current switching. The conventional equivalent resistance concept, which assumes a single conduction path of the resonant current, is generalized to model the losses in cases where the resonant current is divided across several conduction loops. The new modeling concept is compatible to describe the losses resulting from resistive elements as well as P-N junction devices, offering a closed-form solution for the equivalent resistance. Verification of the concept has been carried out by simulations and experiments on 3-30W unity and double gain resonant SCC with free-wheeling ZCS. A very good agreement is obtained between the theoretical calculations, simulations and experimental results, well demonstrating the model capability to identify the loss contributors in each conduction path.
  • Keywords
    p-n junctions; resonant power convertors; zero current switching; P-N junction devices; conduction loops; conduction path; double gain resonant SCC; equivalent resistance concept; free-wheeling ZCS; loss contributors; power 3 W to 30 W; resistive elements; resonant current; resonant switched capacitor converters; self-commutation zero current switching; unified modeling methodology; unity gain resonant SCC; Capacitors; Discharges (electric); RLC circuits; Resistance; Solid modeling; Switches; Zero current switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2014 Twenty-Ninth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • Type

    conf

  • DOI
    10.1109/APEC.2014.6803718
  • Filename
    6803718