Title :
Effect of Film Thickness on Magnetic Properties of FePt Thin Films Deposited on Amorphous
Substrate Directly
Author :
Shen, C.L. ; Kuo, P.C. ; Lin, G.P. ; Chen, S.C. ; Huang, K.T.
Author_Institution :
Inst. of Mater. Sci. & Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
FePt thin films with different thicknesses (2.5-30 nm) were deposited alternately with Fe and Pt layers on amorphous SiO2 substrate without any underlayer and then were postannealed at 700°C for 30 min. The dependences of microstructures, degree of ordering, and magnetic properties on FePt film thickness were investigated. The fct-FePt (001) texture films could be obtained by dc magnetron sputtering of (Fe/Pt)n multilayer on amorphous SiO2 substrate after annealing at 700°C for 30 min. The increasing degree of L10 ordering was probably due to the thicker films providing more L10-ordering nucleation sites. The island-like FePt grains formed on the SiO2 substrates as the film was thinner than 7.5 nm. Both the values of out-of-plane squareness (S⊥) and coercivity (Hc⊥) were higher than those of in-plane ones for all film thicknesses. The values of S⊥ are close to 1 and Hc⊥ are in the range of 9.0-15 kOe for FePt thin films with a thickness of 5-15 nm after annealing at 700°C for 30 min.
Keywords :
annealing; iron alloys; magnetic thin films; nucleation; platinum alloys; silicon compounds; sputter deposition; FePt; SiO2; amorphous substrate; dc magnetron sputtering; film thickness; island-like grains; magnetic properties; nucleation sites; size 2.5 nm to 30 nm; temperature 700 C; thin films; time 30 min; Amorphous magnetic materials; Annealing; Coercive force; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Substrates; Magnetic films; magnetic hysteresis; magnetic recording; perpendicular magnetic anisotropy; perpendicular magnetic recording;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2011.2151836