DocumentCode
1330955
Title
RFID and EMC
Author
Guerrieri, Jeff
Author_Institution
National Institute of Standards and Technology (NIST), USA
Volume
1
Issue
3
fYear
2012
Firstpage
91
Lastpage
91
Abstract
The application of RFID encompasses a variety of advancing technologies and is continuously evolving. This special topic section on RFID presents a sample of interference issues, and the metrology to improve test methods and procedures necessary to support this evolving technology.
Keywords
Electromagnetic compatibility; Electromagnetics; Interference; Inventory control; Radiofrequency identification; Standards;
fLanguage
English
Journal_Title
Electromagnetic Compatibility Magazine, IEEE
Publisher
ieee
ISSN
2162-2264
Type
jour
DOI
10.1109/MEMC.2012.6347062
Filename
6347062
Link To Document