DocumentCode
1331105
Title
Magnetic field measurements with a novel surface micromachined magnetic-field sensor
Author
Emmerich, Harald ; Schöfthaler, Martin
Author_Institution
Autom. Equip. Div., Robert Bosch GmbH, Reutlingen, Germany
Volume
47
Issue
5
fYear
2000
fDate
5/1/2000 12:00:00 AM
Firstpage
972
Lastpage
977
Abstract
The surface micromachining process of Robert Bosch GmbH has been used to fabricate a novel type of magnetic-field sensor. The Lorentz force, caused by the interaction of a current and an external magnetic field in a suspended surface micromachined conducting beam, laterally displaces the suspended structure. The displacement of the structure is converted into a capacitance change by comb-electrodes, which form a differential capacitor. An appropriate electronic circuitry measures the magnetic field by quantifying the displacement of the conducting beam. In order to increase sensitivity to magnetic fields, the magnitude of the deflection is increased by resonant operation in a vacuum ambient. The sensor obtains its vacuum environment by encapsulation with a new wafer bonding process. Prototype sensors with resonant frequencies in the range around 1300 Hz show Q-factors above 30. With these samples, relative magnetic sensitivities of 900 000 (V/A·T) with a detection limit in the sub μT-range are reported
Keywords
capacitance; encapsulation; magnetic field measurement; magnetic sensors; micromachining; microsensors; sensitivity; wafer bonding; 1300 Hz; Lorentz force; Q-factors; capacitance change; comb-electrodes; differential capacitor; electronic circuitry; encapsulation; high sensitivity; lateral displacement; magnetic field measurements; magnetic-field sensor; resonant operation; surface micromachined conducting beam; surface micromachined sensor; suspended conducting beam; vacuum ambient; wafer bonding process; Capacitance; Capacitors; Displacement measurement; Lorentz covariance; Magnetic circuits; Magnetic field measurement; Magnetic levitation; Magnetic resonance; Magnetic sensors; Micromachining;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.841228
Filename
841228
Link To Document