• DocumentCode
    1331105
  • Title

    Magnetic field measurements with a novel surface micromachined magnetic-field sensor

  • Author

    Emmerich, Harald ; Schöfthaler, Martin

  • Author_Institution
    Autom. Equip. Div., Robert Bosch GmbH, Reutlingen, Germany
  • Volume
    47
  • Issue
    5
  • fYear
    2000
  • fDate
    5/1/2000 12:00:00 AM
  • Firstpage
    972
  • Lastpage
    977
  • Abstract
    The surface micromachining process of Robert Bosch GmbH has been used to fabricate a novel type of magnetic-field sensor. The Lorentz force, caused by the interaction of a current and an external magnetic field in a suspended surface micromachined conducting beam, laterally displaces the suspended structure. The displacement of the structure is converted into a capacitance change by comb-electrodes, which form a differential capacitor. An appropriate electronic circuitry measures the magnetic field by quantifying the displacement of the conducting beam. In order to increase sensitivity to magnetic fields, the magnitude of the deflection is increased by resonant operation in a vacuum ambient. The sensor obtains its vacuum environment by encapsulation with a new wafer bonding process. Prototype sensors with resonant frequencies in the range around 1300 Hz show Q-factors above 30. With these samples, relative magnetic sensitivities of 900 000 (V/A·T) with a detection limit in the sub μT-range are reported
  • Keywords
    capacitance; encapsulation; magnetic field measurement; magnetic sensors; micromachining; microsensors; sensitivity; wafer bonding; 1300 Hz; Lorentz force; Q-factors; capacitance change; comb-electrodes; differential capacitor; electronic circuitry; encapsulation; high sensitivity; lateral displacement; magnetic field measurements; magnetic-field sensor; resonant operation; surface micromachined conducting beam; surface micromachined sensor; suspended conducting beam; vacuum ambient; wafer bonding process; Capacitance; Capacitors; Displacement measurement; Lorentz covariance; Magnetic circuits; Magnetic field measurement; Magnetic levitation; Magnetic resonance; Magnetic sensors; Micromachining;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.841228
  • Filename
    841228