• DocumentCode
    1331235
  • Title

    Conductivity Discontinuity in Type of Current-Perpendicular-to-Plane Nanometer Device

  • Author

    Shiiki, K. ; Horikiri, K. ; Takeuchi, Ichiro ; Ono, Shintaro

  • Author_Institution
    Dept. of Appl. Phys. & Physico-Inf., Keio Univ., Yokohama, Japan
  • Volume
    47
  • Issue
    10
  • fYear
    2011
  • Firstpage
    3132
  • Lastpage
    3134
  • Abstract
    The electron conduction through paths of nanometer size in a current-perpendicular-to-plane device is studied. The model of a free electron confined to the square well potential is proposed. The model leads a conductivity discontinuity and a peak of the current spectrum, d2i/dV2. Several peaks are observed in the current spectra of a CPP-GMR device with current screen layer, of which size of the current path observed by the conductive-AFM is about 6 nm. The peak voltage is on the same level with the estimated value by the model, although the magnetic behavior cannot be understood. There exist several peaks in the current spectra of a tunneling junction broken by an excessive pulse voltage. It is estimated from the model that the size of the pinhole caused by the breakdown is about 1 nm.
  • Keywords
    giant magnetoresistance; magnetoelectronics; tunnelling magnetoresistance; conductivity discontinuity; current spectrum; current-perpendicular-to-plane nanometer device; electron conduction; free electron; nanometer size; square well potential; tunneling junction; Conductivity; Junctions; Magnetic recording; Magnetic tunneling; Magnetization; Voltage measurement; Giant magneto-resistance; magneto-electronics; thin film devices; tunneling magneto-resistance;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2152369
  • Filename
    6028017