Title :
Stroboscopic Technique for Measuring Magnetic-Field Waveforms Utilizing Magneto-Optical Effect
Author :
Nasuno, H. ; Hashi, Shuichiro ; Ishiyama, Kazushi
Author_Institution :
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
Abstract :
Electromagnetic interference (EMI) is a serious problem in integrated circuits (ICs). Many methods for measuring EMI have been developed. These methods generally use metal probes to measure electromagnetic waves; however, metal probes alter the electromagnetic field. Furthermore, measurement techniques that have very high time resolutions are required because of the high operating frequencies of ICs. Measurements that use the magneto-optical effect can overcome both these problems. Magneto-optical materials affect electromagnetic waves less than metal probes and optical measurements are advantageous for minimally invasive measurements of magnetic fields. To achieve a high resolution, we developed a stroboscopic method that employs short laser pulses. This method can measure a magnetic field in any phase because the laser pulses are synchronized with the magnetic field. Measurements of magnetic-field waveforms demonstrated that this stroboscopic method is effective for measuring magnetic-field waveforms.
Keywords :
electromagnetic compatibility; electromagnetic interference; integrated circuits; magnetic field measurement; magneto-optical effects; stroboscopes; electromagnetic field; electromagnetic interference; electromagnetic wave; integrated circuits; laser pulse; magnetic field waveform; magneto-optical effect; magneto-optical materials; metal probe; stroboscopic technique; Frequency measurement; Magnetic noise; Magnetic resonance imaging; Magnetic shielding; Measurement by laser beam; Phase measurement; Transmission line measurements; Electromagnetic compatibility; magnetic-field measurement; magneto-optical effect;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2011.2147775