Title :
Auger transitions and their signatures in III-nitride LEDs: A full-band modeling
Author :
Bertazzi, Francesco ; Xiangyu Zhou ; Goano, Michele ; Ghione, G. ; Bellotti, Enrico
Author_Institution :
Dipt. di Elettron. e Telecomun., Politec. di Torino, Turin, Italy
Abstract :
Auger recombination and the relaxation of the resulting excited electrons are investigated in III-nitride light-emitting diodes (LEDs) with a full-band Monte Carlo carrier transport model to assess the possibility of recovering Auger signatures from experiments. Full-Brillouin-zone calculations of Auger coefficients indicate that Auger recombination may not be negligible for LED operation, although the identification of Auger signatures from complex experiments should be supported by theoretical calculations before any claim concerning the origin of the efficiency droop can be made.
Keywords :
Auger effect; Monte Carlo methods; electron-hole recombination; light emitting diodes; Auger recombination; Auger signatures; III-nitride LED; electrons; full-Brillouin-zone calculations; full-band Monte Carlo carrier transport model; light-emitting diodes; Gallium nitride; Green products; Light emitting diodes; Materials; Radiative recombination; Scattering;
Conference_Titel :
Numerical Simulation of Optoelectronic Devices (NUSOD), 2014 14th International Conference on
Conference_Location :
Palma de Mallorca
Print_ISBN :
978-1-4799-3681-6
DOI :
10.1109/NUSOD.2014.6935330