DocumentCode :
1332063
Title :
Guest editorial
Author :
Taguchi, M. ; Scott, David B.
Volume :
35
Issue :
5
fYear :
2000
fDate :
5/1/2000 12:00:00 AM
Firstpage :
670
Lastpage :
671
Keywords :
CMOS technology; Capacitors; Circuits; Ferroelectric films; Fingerprint recognition; Nonvolatile memory; Paper technology; Random access memory; Ultra large scale integration; Very large scale integration;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2000.841462
Filename :
841462
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1332063
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