Title :
Formulations and a Computer-Aided Test Method for the Estimation of IMD Levels in an Envelope Feedback RFIC Power Amplifier
Author :
Constantin, Nicolas G. ; Kwok, Kai H. ; Shao, Hongxiao ; Cismaru, Cristian ; Zampardi, Peter J.
Author_Institution :
Ecole de Technol. Super., Montreal, QC, Canada
Abstract :
This paper presents new formulations, together with an efficient computer-aided test approach intended for radio frequency integrated circuit power amplifiers (PAs), allowing the estimation of linearity requirements for the circuit blocks typically found in the error signal path of an envelope feedback amplifier. The formulations are based on a three-tone excitation, allowing analysis of intermodulation distortion (IMD) within the feedback system using parameterized peak-to-average envelope voltage. They are also based on a fifth-degree representation, and may be extended to higher degrees of nonlinearities in the RF PA block, enabling IMD analysis of envelope feedback amplifiers at low power. The approach proposed in this paper circumvents the difficulty of measuring error signals during closed-loop operation for troubleshooting purposes. This approach is also very useful for computer-aided test setups intended for development work independent of the often idealized circuit simulation environment.
Keywords :
power amplifiers; radiofrequency integrated circuits; IMD levels; circuit blocks; closed loop operation; computer aided test method; computer aided test setups; envelope feedback RFIC power amplifier; envelope feedback amplifier; envelope feedback amplifiers; error signals; feedback system; fifth degree representation; idealized circuit simulation environment; intermodulation distortion; linearity requirements; parameterized peak-to-average envelope voltage; radio frequency integrated circuit power amplifiers; three tone excitation; troubleshooting; Amplifiers; Feedback amplifier; Intermodulation distortion; Power amplifiers; Amplifier; envelope feedback; intermodulation distortion;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2012.2207954