DocumentCode :
1332416
Title :
Silicon-on-Insulator In-Plane Gires–Tournois Interferometers
Author :
St-Gelais, Raphael ; Kerrien, Thomas ; Camirand, Hubert ; Poulin, Alexandre ; Peter, Yves-Alain
Author_Institution :
Department of Engineering Physics, Polytechnique Montréal, Montreal, Canada
Volume :
24
Issue :
24
fYear :
2012
Firstpage :
2272
Lastpage :
2275
Abstract :
Gires–Tournois interferometers (GTIs) based on deep-etched silicon-air Bragg mirrors and on optical quality dicing of silicon are reported. Broadband reflectivity of the deep-etched Bragg mirrors allows operation on a wavelength range exceeding the C Band window. The waveguided in-plane configuration of the devices allows interferometer lengths that are not typically achievable on chips using out-of-plane designs (e.g., L>1~{\\rm mm} for a 25-GHz free spectral range). Optical characterization of GTIs having two different free spectral ranges (i.e., 25 and 100 GHz) yield off-resonance insertion losses below 2 dB and polarization-dependant losses (PDL) below 1 dB. Insertion losses and PDL are, however, more important near the resonance wavelengths, reaching, respectively, 15 and 5 dB. Calculations show that the reported devices could be useful for Michelson-GTI bandpass filters, such as optical interleavers.
Keywords :
Integrated optics; Interferometers; Mirrors; Optical fiber dispersion; Optical waveguides; Reflectivity; Silicon on insulator technology; Integrated optics; interferometers; optical waveguides; silicon-on-insulator technology;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2012.2227142
Filename :
6352838
Link To Document :
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