• DocumentCode
    1332582
  • Title

    Design for nonsymmetrical statistical distributions

  • Author

    Wojciechowski, Jacek ; Vlach, Jiri ; Opalski, Leszek

  • Author_Institution
    Inst. of Electron. Fundamentals, Warsaw Univ. of Technol., Poland
  • Volume
    44
  • Issue
    1
  • fYear
    1997
  • fDate
    1/1/1997 12:00:00 AM
  • Firstpage
    29
  • Lastpage
    37
  • Abstract
    This paper presents a method for approximation of the constraint region and design centering for statistically distributed design parameters. Arbitrary uncorrelated probability density functions (p.d.f.´s) are considered, including truncated ones. The approximation problem is formulated deterministically and solved by optimization. The constraint region is approximated by a family of second-order ellipsoidal type functions. Formulation of the approximation problem takes into account statistical distributions of parameters, to be used in subsequent design centering. A special metric replaces evaluation of a multidimensional (yield) integral over the constraint region by simple integrals over fixed intervals. An additional outcome of the approximation process is location of a nominal design that increases yield
  • Keywords
    approximation theory; constraint theory; design engineering; optimisation; statistical analysis; approximation; constraint region; design centering; design parameters; ellipsoidal function; metric; nonsymmetrical statistical distribution; optimization; probability density function; yield; Circuit simulation; Circuit testing; Costs; Design methodology; Design optimization; Electronic circuits; Multidimensional systems; Probability density function; Production; Statistical distributions;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.558439
  • Filename
    558439