DocumentCode
1332603
Title
Quantum Size Effects on Vanadium Nanoparticles
Author
Chun-Chuen Yang ; Wei-Luen Huang ; Yi-Hsin Lin ; Chang-Yu Weng ; Zh-Yu Mo ; Yang-Yuan Chen
Author_Institution
Dept. of Phys., Chung Yuan Christian Univ., Chungli, Taiwan
Volume
47
Issue
10
fYear
2011
Firstpage
3535
Lastpage
3537
Abstract
Vanadium nanoparticles of two sizes were fabricated by pulse laser deposition. Transmission electron microscopy (TEM) images revealed that the diameters of the particles two samples were 2.5 and 4 nm. X-ray diffraction was used to determine the purity and lattice constant. Both samples were in the cubic 1-3-m phase. The lattice constants increased with diameter: the 4- and 2.5-nm samples had constants that were 0.42% and 0.55% larger than the lattice constant of the bulk, respectively. Superconductivity behaviors were determined by experiments on magnetic susceptibility. No Meissner effect was observed in the 2.5-nm nanoparticles. The Tc of the 4-nm nanoparticles was about 5.4 K, and accompanied a Hc of about 500 Oe. The critical diameter of vanadium nanoparticles for superconductivity can be estimated using Kubo theory1,2. The calculated critical diameter of the Kubo gap for superconductivity (~ 1.6 meV) is about 3 nm. This fact is believed to be the main explanation of the lack of superconductivity in 2.5-nm nanoparticles.
Keywords
Meissner effect; X-ray diffraction; lattice constants; magnetic susceptibility; nanofabrication; nanoparticles; pulsed laser deposition; size effect; transmission electron microscopy; type II superconductors; vanadium; Kubo gap; Kubo theory; Meissner effect; TEM; V; X-ray diffraction; lattice constant; magnetic susceptibility; pulse laser deposition; quantum size effects; size 1 nm to 4 nm; superconductivity; transmission electron microscopy; vanadium nanoparticles; Magnetic susceptibility; Metals; Nanoparticles; Solids; Superconducting magnets; X-ray diffraction; Critical diameter; Kubo gap; nano; superconductivity;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2011.2146762
Filename
6028244
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