• DocumentCode
    133265
  • Title

    Overvoltage protection scheme for three-phase current source converter built with SiC MOSFETs

  • Author

    Ben Guo ; Fan Xu ; Wang, F. ; Tolbert, Leon M. ; Blalock, Benjamin J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
  • fYear
    2014
  • fDate
    16-20 March 2014
  • Firstpage
    3469
  • Lastpage
    3476
  • Abstract
    The overvoltage caused by dc-link inductor current interruption is a serious problem in the current source converters. It becomes an even more challenging issue when the fast-switching SiC MOSFETs are applied as switches in these converters. The protection is required to have nanosecond-level response time to protect the devices. Addressing this challenge, this paper proposes a novel overvoltage protection scheme constituted by a diode bridge and the high-power transient-voltage-suppression (TVS) diodes. It can detect and clamp the overvoltage within less than 50 ns to protect the device from breakdown. When the energy in the inductor is small, it can be dissipated in the TVS diodes. Otherwise, a capacitor in series with a thyristor can be added to absorb the energy. The effectiveness of the protection scheme has been verified by experiments in a 7.5 kW current source rectifier built with SiC MOSFETs.
  • Keywords
    MOSFET; overvoltage protection; rectifiers; silicon compounds; thyristors; SiC; TVS diodes; current source rectifier; dc-link inductor current interruption; diode bridge; fast-switching MOSFET; high-power transient-voltage-suppression diodes; nanosecond-level response time; overvoltage protection scheme; power 7.5 kW; three-phase current source converter; thyristor; Capacitors; Clamps; Inductors; Rectifiers; Resistors; Thyristors; Voltage control; Three-phase current source rectifier; current interruption; overvoltage protection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2014 Twenty-Ninth Annual IEEE
  • Conference_Location
    Fort Worth, TX
  • Type

    conf

  • DOI
    10.1109/APEC.2014.6803808
  • Filename
    6803808