DocumentCode
1333005
Title
Capacitive proximity sensor with negative capacitance generation technique
Author
Cho, Soon-Ik ; Lim, S.-I. ; Baek, Kang-Hyun ; Kim, Sungho
Author_Institution
Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
Volume
48
Issue
22
fYear
2012
Firstpage
1409
Lastpage
1411
Abstract
An oscillator-based capacitive proximity sensor is presented. To improve the sensor´s sensitivity by minimising the effect of parasitic capacitance, the proposed sensor employs a negative capacitance generation technique. The sensor is implemented with a standard 0.18´´m CMOS technology, and the measurement results show that frequency variation is about 1.4´ at 5´cm distance while only consuming an 85´´A current. The die area occupies 520 by 280´´m, and the size of an external sensing plate is 0.5 by 0.5´cm.
Keywords
CMOS integrated circuits; capacitance measurement; capacitive sensors; oscillators; CMOS technology; current 85 A; distance 5 cm; negative capacitance generation technique; oscillator-based capacitive proximity sensor; parasitic capacitance effect; size 0.18 mum;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2012.2783
Filename
6352975
Link To Document