DocumentCode :
1333005
Title :
Capacitive proximity sensor with negative capacitance generation technique
Author :
Cho, Soon-Ik ; Lim, S.-I. ; Baek, Kang-Hyun ; Kim, Sungho
Author_Institution :
Dept. of Electron. Eng., Korea Univ., Seoul, South Korea
Volume :
48
Issue :
22
fYear :
2012
Firstpage :
1409
Lastpage :
1411
Abstract :
An oscillator-based capacitive proximity sensor is presented. To improve the sensor´s sensitivity by minimising the effect of parasitic capacitance, the proposed sensor employs a negative capacitance generation technique. The sensor is implemented with a standard 0.18´´m CMOS technology, and the measurement results show that frequency variation is about 1.4´ at 5´cm distance while only consuming an 85´´A current. The die area occupies 520 by 280´´m, and the size of an external sensing plate is 0.5 by 0.5´cm.
Keywords :
CMOS integrated circuits; capacitance measurement; capacitive sensors; oscillators; CMOS technology; current 85 A; distance 5 cm; negative capacitance generation technique; oscillator-based capacitive proximity sensor; parasitic capacitance effect; size 0.18 mum;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2012.2783
Filename :
6352975
Link To Document :
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