DocumentCode :
1333444
Title :
Test Technology TC Newsletter
Volume :
28
Issue :
5
fYear :
2011
Firstpage :
114
Lastpage :
115
Abstract :
This newsletter provides information on past and upcoming events related to the IEEE Computer Society´s Test Technology Technical Council and the test community.
Keywords :
ATS; DFT; ETS; IMS3TW; ITC; TTTC; design and test; test technology;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2011.116
Filename :
6028544
Link To Document :
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