DocumentCode
1333520
Title
Optically induced mask-controlled time-variable periodic microwave structures
Author
Platte, Walter ; Ruppik, Stefan ; Guetschow, Manfred
Author_Institution
Univ. of the Fed. Armed Forces Hamburg, Germany
Volume
48
Issue
5
fYear
2000
fDate
5/1/2000 12:00:00 AM
Firstpage
846
Lastpage
851
Abstract
Based on the distributed Bragg reflection performance of stationary light-induced periodic microwave structures, this paper presents different kinds of modified arrangements for the generation of time-variable plasma gratings. Initial experimental investigations concentrate on the alteration of the grating period as a function of time. It is realized by a photographic film slot-array mask of linearly graded slot width transversely moved across an light-emitting-diode-excited photosensitive coplanar waveguide. The characterization of such a mask-tuned filter configuration requires special measuring procedures, which are illustrated and discussed in detail. The principle of operation demonstrated at X-band frequencies offers the potential of being extended to the submillimeter-wave and low-terahertz ranges
Keywords
coplanar waveguide components; masks; microwave filters; microwave photonics; passive filters; periodic structures; solid-state plasma; tuning; LED-excited CPW; X-band frequencies; distributed Bragg reflection performance; grating period; light emitting diode excitation; linearly graded slot width; mask-controlled periodic microwave structures; mask-tuned filter configuration; measuring procedures; optically induced periodic microwave structures; photographic film slot-array mask; photosensitive coplanar waveguide; time-variable periodic microwave structures; time-variable plasma gratings generation; Bragg gratings; Microwave generation; Optical films; Optical filters; Optical reflection; Optical waveguides; Periodic structures; Plasma measurements; Plasma waves; Submillimeter wave filters;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.841882
Filename
841882
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