• DocumentCode
    1333848
  • Title

    Reduced-Order Parametric Behavioral Model for Digital Buffers/Drivers With Physical Support

  • Author

    Dghais, Wael ; Cunha, Telmo R. ; Pedro, José C.

  • Author_Institution
    Dept. de Eletron., Telecomun. e Inf., Univ. de Aveiro, Aveiro, Portugal
  • Volume
    2
  • Issue
    12
  • fYear
    2012
  • Firstpage
    2071
  • Lastpage
    2079
  • Abstract
    In this paper, we present a new behavioral model for high-speed digital output buffers/drivers. In the conceived model, the output current´s relationship with the output voltage is expressed as a summation of a static nonlinearity plus linear dynamics. This separation in the model format is supported by the measurements as well as the physical structure of a general driver circuit. This approach merges the features of equivalent circuit and parametric approaches to build a reduced-order parametric behavioral model which, compared to other published models, is more adequate to describe the device´s electrical behavior from transient input-output data. A simple single-step identification procedure is conceived to extract a model that proved to be stable and capable of significantly improving the simulation speed and accuracy of prediction. Finally, the resulting model is validated in a realistic signal integrity simulation setup, and is compared to transistor-level models and to the state-of-the-art input-output buffer information specification model.
  • Keywords
    buffer circuits; digital integrated circuits; driver circuits; equivalent circuits; signal processing; transient analysis; device electrical behavior; equivalent circuit features; general driver circuit; high-speed digital output buffers; linear dynamics; model format; physical structure; physical support; reduced-order parametric behavioral model; signal integrity simulation setup; simulation speed; single-step identification procedure; state-of-the-art input-output buffer information specification model; static nonlinearity; transient input-output data; transistor-level models; Integrated circuit modeling; Mathematical model; Nonlinear systems; Semiconductor device modeling; System identification; Transient analysis; Behavioral modeling; digital output buffers/drivers; nonlinear system identification; signal integrity (SI); transient analysis;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2012.2213254
  • Filename
    6353185