• DocumentCode
    1333903
  • Title

    Thermosonic flip-chip bonding using longitudinal ultrasonic vibration

  • Author

    Tan, Qing ; Zhang, Wenge ; Schaible, Brian ; Bond, Leonard J. ; Ju, Teh-Hua ; Lee, Yung-Cheng

  • Author_Institution
    Centre for Adv. Manuf. & Packaging of Microwave, Opt., & Digital Electron., Colorado Univ., Boulder, CO, USA
  • Volume
    21
  • Issue
    1
  • fYear
    1998
  • fDate
    2/1/1998 12:00:00 AM
  • Firstpage
    53
  • Lastpage
    58
  • Abstract
    Flip-chip assembly is an important technology for first level electronic packaging. Among different assembly approaches, thermosonic bonding is becoming an attractive choice because it is cost-effective. To increase the bonding capability for high input/output (I/O) assembly, a novel longitudinal bonding system was developed in this study. This bonding system has two advantages over the transverse bonding system: it overcomes the planarity problem and simplifies bonding tool configuration. During the development, an end-effector was designed with rigorous considerations of ultrasonic wave propagation, bonding force and co-planarity between the chip holder and hot stage. The bonding system was then characterized to make sure that it is suitable for flip-chip assembly. This bonding technology was proven successful by mechanical bonding tests as well as a functional complementary metal-oxide-semiconductor/static random access memory (CMOS/SRAM) module demonstration. During the bonding process, the chip is under longitudinal ultrasonic “hammering.” However, there is no apparent damage because the impact stress is low due to the low ultrasonic vibration amplitude
  • Keywords
    flip-chip devices; integrated circuit packaging; lead bonding; ultrasonic applications; CMOS/SRAM module; assembly; coplanarity; end effector; first level electronic packaging; hammering; impact stress; longitudinal ultrasonic vibration; mechanical bonding; thermosonic flip-chip bonding; Assembly systems; Bonding forces; Bonding processes; CMOS technology; Electronics packaging; Random access memory; SRAM chips; Stress; Testing; Vibrations;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.659506
  • Filename
    659506