• DocumentCode
    1334034
  • Title

    Adhesion issued in epoxy-based chip attach adhesives

  • Author

    Pearson, Raymond A. ; Lloyd, Tom B. ; Azimi, Hamid R. ; Hsiung, Jen-Chou ; Early, Malcolm S. ; Brandenburger, Peter D.

  • Author_Institution
    Lehigh Univ., Bethlehem, PA, USA
  • Volume
    20
  • Issue
    1
  • fYear
    1997
  • fDate
    3/1/1997 12:00:00 AM
  • Firstpage
    31
  • Lastpage
    37
  • Abstract
    This paper focuses on the effects of surface chemistry and processing conditions on the adhesive strength of epoxy-based chip attach adhesives on typical leadframe substrates. The surface chemistry is characterized using a three liquid probe method, which quantifies the polar and apolar contributions to the thermodynamic work of adhesion. Practical adhesion is quantified using interfacial fracture mechanics. The effect of processing conditions on adhesion is summarized using “bondability diagrams”, which are modeled after moldability diagrams used in reaction injection molding processes. Preliminary bondability diagrams are given for several silver-filled, epoxy-based chip attach adhesives. These diagrams are constructed from a fundamental understanding of cure kinetics, degradation mechanisms, void phenomena, and contraction during cure. Verification of such diagrams is in progress and the agreement thus far is very satisfactory
  • Keywords
    adhesion; filled polymers; fracture mechanics; integrated circuit packaging; surface chemistry; adhesive strength; bondability diagram; chip attach adhesive; contraction; cure kinetics; degradation; interfacial fracture mechanics; leadframe substrate; liquid probe; silver-filled epoxy; surface chemistry; surface processing; thermodynamic work of adhesion; void; Adhesives; Bonding; Chemistry; Delamination; Electronics packaging; Lead; Moisture; Plastic packaging; Surface cracks; Temperature;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.558541
  • Filename
    558541