DocumentCode
1334034
Title
Adhesion issued in epoxy-based chip attach adhesives
Author
Pearson, Raymond A. ; Lloyd, Tom B. ; Azimi, Hamid R. ; Hsiung, Jen-Chou ; Early, Malcolm S. ; Brandenburger, Peter D.
Author_Institution
Lehigh Univ., Bethlehem, PA, USA
Volume
20
Issue
1
fYear
1997
fDate
3/1/1997 12:00:00 AM
Firstpage
31
Lastpage
37
Abstract
This paper focuses on the effects of surface chemistry and processing conditions on the adhesive strength of epoxy-based chip attach adhesives on typical leadframe substrates. The surface chemistry is characterized using a three liquid probe method, which quantifies the polar and apolar contributions to the thermodynamic work of adhesion. Practical adhesion is quantified using interfacial fracture mechanics. The effect of processing conditions on adhesion is summarized using “bondability diagrams”, which are modeled after moldability diagrams used in reaction injection molding processes. Preliminary bondability diagrams are given for several silver-filled, epoxy-based chip attach adhesives. These diagrams are constructed from a fundamental understanding of cure kinetics, degradation mechanisms, void phenomena, and contraction during cure. Verification of such diagrams is in progress and the agreement thus far is very satisfactory
Keywords
adhesion; filled polymers; fracture mechanics; integrated circuit packaging; surface chemistry; adhesive strength; bondability diagram; chip attach adhesive; contraction; cure kinetics; degradation; interfacial fracture mechanics; leadframe substrate; liquid probe; silver-filled epoxy; surface chemistry; surface processing; thermodynamic work of adhesion; void; Adhesives; Bonding; Chemistry; Delamination; Electronics packaging; Lead; Moisture; Plastic packaging; Surface cracks; Temperature;
fLanguage
English
Journal_Title
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher
ieee
ISSN
1070-9886
Type
jour
DOI
10.1109/95.558541
Filename
558541
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