DocumentCode :
1334034
Title :
Adhesion issued in epoxy-based chip attach adhesives
Author :
Pearson, Raymond A. ; Lloyd, Tom B. ; Azimi, Hamid R. ; Hsiung, Jen-Chou ; Early, Malcolm S. ; Brandenburger, Peter D.
Author_Institution :
Lehigh Univ., Bethlehem, PA, USA
Volume :
20
Issue :
1
fYear :
1997
fDate :
3/1/1997 12:00:00 AM
Firstpage :
31
Lastpage :
37
Abstract :
This paper focuses on the effects of surface chemistry and processing conditions on the adhesive strength of epoxy-based chip attach adhesives on typical leadframe substrates. The surface chemistry is characterized using a three liquid probe method, which quantifies the polar and apolar contributions to the thermodynamic work of adhesion. Practical adhesion is quantified using interfacial fracture mechanics. The effect of processing conditions on adhesion is summarized using “bondability diagrams”, which are modeled after moldability diagrams used in reaction injection molding processes. Preliminary bondability diagrams are given for several silver-filled, epoxy-based chip attach adhesives. These diagrams are constructed from a fundamental understanding of cure kinetics, degradation mechanisms, void phenomena, and contraction during cure. Verification of such diagrams is in progress and the agreement thus far is very satisfactory
Keywords :
adhesion; filled polymers; fracture mechanics; integrated circuit packaging; surface chemistry; adhesive strength; bondability diagram; chip attach adhesive; contraction; cure kinetics; degradation; interfacial fracture mechanics; leadframe substrate; liquid probe; silver-filled epoxy; surface chemistry; surface processing; thermodynamic work of adhesion; void; Adhesives; Bonding; Chemistry; Delamination; Electronics packaging; Lead; Moisture; Plastic packaging; Surface cracks; Temperature;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.558541
Filename :
558541
Link To Document :
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