• DocumentCode
    1334295
  • Title

    Process induced residual stresses in isotropically conductive adhesive joints

  • Author

    Wu, Sean X. ; Yuhai Mel ; Yeh, Chao-pin ; Wyatt, Karl W.

  • Author_Institution
    Corp. Software Center, Motorola Inc., Schaumburg, IL, USA
  • Volume
    19
  • Issue
    4
  • fYear
    1996
  • fDate
    10/1/1996 12:00:00 AM
  • Firstpage
    251
  • Lastpage
    256
  • Abstract
    Mechanical and thermomechanical tests were conducted to characterize conductive adhesives in terms of dimensional stability and viscoelastic properties. Dynamic testing results were converted from the frequency domain into the time domain. Those results were then incorporated into the ABAQUS finite element (FE) code, in which a finite element analysis (FEA) was conducted to investigate the stress development and stress relaxation process in the conductive adhesive joints by taking into account the viscoelastic properties of the conductive adhesive. Experimental results showed that the stresses in the conductive adhesive can relax significantly at elevated temperatures. Based on the experimental data and FEA result, a new cure schedule is proposed for the conductive adhesive studied
  • Keywords
    adhesion; conducting materials; finite element analysis; internal stresses; stress relaxation; viscoelasticity; ABAQUS code; curing; dimensional stability; dynamic testing; finite element analysis; isotropically conductive adhesive joint; mechanical testing; residual stress; stress relaxation; thermomechanical testing; viscoelastic properties; Conductive adhesives; Elasticity; Finite element methods; Frequency domain analysis; Mechanical factors; Residual stresses; Testing; Thermal stability; Thermomechanical processes; Viscosity;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part C, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4400
  • Type

    jour

  • DOI
    10.1109/3476.558551
  • Filename
    558551