DocumentCode :
1334352
Title :
Worst-case temperature analysis for different resource models
Author :
Schor, Lars ; Yang, Hongming ; Bacivarov, Iuliana ; Thiele, Lothar
Author_Institution :
Dept. of Inf. Technol. & Electr. Eng., ETH Zurich, Zurich, Switzerland
Volume :
6
Issue :
5
fYear :
2012
Firstpage :
297
Lastpage :
307
Abstract :
The rapid increase in heat dissipation in real-time systems imposes various thermal issues. For instance, real-time constraints cannot be guaranteed if a certain threshold temperature is exceeded, as it would immediately reduce the system reliability and performance. Dynamic thermal management techniques are promising methods to prevent a system from overheating. However, when designing real-time systems that make use of such thermal management techniques, the designer has to be aware of their effect on both real-time constraints and worst-case peak temperature. In particular, the worst-case peak temperature of a real-time system with non-deterministic workload is the maximum possible temperature under all feasible scenarios of task arrivals. This study proposes an analytic framework to calculate the worst-case peak temperature of a system with general resource availabilities, which means that computing power might not be fully available for certain time intervals. The event and resource models are based on real-time and network calculus, and therefore, our analysis method is able to handle a broad range of uncertainties in terms of task arrivals and available computing power. Finally, we propose an indicator for the quality of the resource model with respect to worst-case peak temperature and schedulability.
Keywords :
reliability; thermal management (packaging); dynamic thermal management techniques; general resource availabilities; heat dissipation; network calculus; nondeterministic workload; real-time constraints; real-time systems; resource models; system reliability; task arrivals; thermal issues; worst-case peak schedulability; worst-case peak temperature analysis;
fLanguage :
English
Journal_Title :
Circuits, Devices & Systems, IET
Publisher :
iet
ISSN :
1751-858X
Type :
jour
DOI :
10.1049/iet-cds.2011.0369
Filename :
6353346
Link To Document :
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