Title :
An Energy-Efficient and High-Speed Mobile Memory I/O Interface Using Simultaneous Bi-Directional Dual (Base+RF)-Band Signaling
Author :
Byun, Gyung-Su ; Kim, Yanghyo ; Kim, Jongsun ; Tam, Sai-Wang ; Chang, Mau-Chung Frank
Author_Institution :
Lane Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
Abstract :
A fully-integrated 8.4 Gb/s 2.5 pJ/b mobile memory I/O transceiver using simultaneous bidirectionaldual band signaling is presented. Incorporating both RF-band and baseband transceiver designs, this prototype demonstrates an energy-efficient and high-bandwidth solution for future mobile memory I/O interface. The proposed amplitude shift keying (ASK) modulator/demodulator with on-chip band-selective transformer obviates a power hungry pre-emphasis and equalization circuitry, revealing a low-power, compact and standard mobile memory-compatible solution. Designed and fabricated in 65-nm CMOS technology, each RF-band and baseband transceiver consumes 10.5 mW and 11 mW and occupies 0.08 mm2 and 0.06 mm2 die area, respectively. The dual-band transceiver achieves error-free operation (BER <; 10-15 ) with 223- 1 PRBS at 8.4 Gb/s over a distance of 10 cm.
Keywords :
CMOS integrated circuits; amplitude shift keying; demodulators; equalisers; error statistics; radio transceivers; ASKdemodulator; CMOS technology; RF-band; amplitude shift keying; baseband transceiver design; bidirectionaldual band signaling; bit error rate; dual-band transceiver; energy-efficient mobile memory I/O interface; equalization circuitry; error-free operation; fully-integrated mobile memory I/O transceiver; high-bandwidth solution; high-speed mobile memory I/O interface; on-chip band-selective transformer; power 10.5 mW; power 11 mW; size 65 nm; Amplitude shift keying; Impedance; Mobile communication; Random access memory; Synchronization; Transceivers; Amplitude-shift-keying (ASK); dual-band signaling; impedance transformation; mobile memory interface; multi-band RF-Interconnect (RF-I); simultaneous bidirectional;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2011.2164709