Title :
Traceview: a trace visualization tool
Author :
Malony, Allen D. ; Hammerslag, David H. ; Jablonowski, David J.
Author_Institution :
Center for Supercomput. Res. & Dev., Illinois Univ., Urbana, IL, USA
Abstract :
The design, development, and application of Traceview, a general-purpose trace-visualization tool that implements the trace-management and I/O features usually found in special-purpose trace-analysis systems, are described. The aspects of trace visualization that can be incorporated into a reusable tool are identified. The tradeoff in general-purpose design versus semantically based, detailed trace-data analysis is evaluated. Display methods and Traceview applications are discussed.<>
Keywords :
computer graphics; performance evaluation; program testing; software tools; I/O features; Traceview; reusable tool; trace visualization tool; trace-analysis systems; trace-data analysis; trace-management; Data visualization; Displays; Filtering; Merging; Performance analysis; Research and development; Tree data structures;
Journal_Title :
Software, IEEE
