DocumentCode
1335589
Title
Study of Broadband Cryogenic DC-Contact RF MEMS Switches
Author
Gong, Songbin ; Shen, Hui ; Barker, N. Scott
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
Volume
57
Issue
12
fYear
2009
Firstpage
3442
Lastpage
3449
Abstract
A dielectric-free DC-contact RF microelectromechanical system (MEMS) switch is designed and tested at room temperature and cryogenic temperatures. The switch demonstrates a 1-?? contact resistance and 2 fF up-state capacitance at room temperature, with an insertion-loss less than 0.4 dB up to 50 GHz and less than 0.9 dB up to 75 GHz. The isolation is better than 24 dB up to 50 GHz and 18 dB up to 75 GHz at room temperature. At a cryogenic temperature of 1.6 K, the switch has an insertion loss less than 0.6 dB with isolation better than 24 dB up to 50 GHz. The effects of cryogenic temperatures on deformation of the cantilever beam, actuation voltage, and RF performance have been noted. The theoretical and experimental results of the switch performance are presented and compared.
Keywords
beams (structures); cantilevers; capacitance; contact resistance; deformation; microswitches; DC-contact RF microelectromechanical system switch; actuation voltage; broadband DC-contact RF MEMS switches; cantilever beam; contact resistance; cryogenic RF MEMS switches; deformation; dielectric-free RF microelectromechanical system switch; frequency 50 GHz; frequency 75 GHz; insertion loss; resistance 1 ohm; room temperature; temperature 1.6 K; temperature 293 K to 298 K; up-state capacitance; Broadband; DC-contact; MEMS; cantilever; contact resistance; cryogenic; low loss; series switch;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2009.2033872
Filename
5337897
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