• DocumentCode
    1335589
  • Title

    Study of Broadband Cryogenic DC-Contact RF MEMS Switches

  • Author

    Gong, Songbin ; Shen, Hui ; Barker, N. Scott

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
  • Volume
    57
  • Issue
    12
  • fYear
    2009
  • Firstpage
    3442
  • Lastpage
    3449
  • Abstract
    A dielectric-free DC-contact RF microelectromechanical system (MEMS) switch is designed and tested at room temperature and cryogenic temperatures. The switch demonstrates a 1-?? contact resistance and 2 fF up-state capacitance at room temperature, with an insertion-loss less than 0.4 dB up to 50 GHz and less than 0.9 dB up to 75 GHz. The isolation is better than 24 dB up to 50 GHz and 18 dB up to 75 GHz at room temperature. At a cryogenic temperature of 1.6 K, the switch has an insertion loss less than 0.6 dB with isolation better than 24 dB up to 50 GHz. The effects of cryogenic temperatures on deformation of the cantilever beam, actuation voltage, and RF performance have been noted. The theoretical and experimental results of the switch performance are presented and compared.
  • Keywords
    beams (structures); cantilevers; capacitance; contact resistance; deformation; microswitches; DC-contact RF microelectromechanical system switch; actuation voltage; broadband DC-contact RF MEMS switches; cantilever beam; contact resistance; cryogenic RF MEMS switches; deformation; dielectric-free RF microelectromechanical system switch; frequency 50 GHz; frequency 75 GHz; insertion loss; resistance 1 ohm; room temperature; temperature 1.6 K; temperature 293 K to 298 K; up-state capacitance; Broadband; DC-contact; MEMS; cantilever; contact resistance; cryogenic; low loss; series switch;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2009.2033872
  • Filename
    5337897