• DocumentCode
    1335626
  • Title

    Full-Swing a-IGZO Inverter With a Depletion Load Using Negative Bias Instability Under Light Illumination

  • Author

    Cho, In-Tak ; Lee, Ju-Wan ; Park, Jun-Mo ; Cheong, Woo-Seok ; Hwang, Chi-Sun ; Kwak, Joon-Seop ; Cho, Il-Hwan ; Kwon, Hyuck-In ; Shin, Hyungcheol ; Park, Byung-Gook ; Lee, Jong-Ho

  • Author_Institution
    Sch. of EECS, Seoul Nat. Univ., Seoul, South Korea
  • Volume
    33
  • Issue
    12
  • fYear
    2012
  • Firstpage
    1726
  • Lastpage
    1728
  • Abstract
    A high-performance amorphous indium-gallium-zinc-oxide thin-film transistor (TFT) inverter, which is composed of an enhancement mode driver and a depletion mode load, is implemented by selectively inducing the negative bias illumination temperature stress (NBITS) to the load TFT. Under NBITS, the transfer curve of the load TFT shows a parallel shift into the negative bias direction without a significant change in the subthreshold slope and recovers very slowly after terminating the NBITS even under harsh bias and temperature stress conditions. The proposed inverter shows much improved switching characteristics including higher voltage gain, wider swing range, and higher noise margins compared to the conventional inverter with an enhancement load.
  • Keywords
    II-VI semiconductors; amorphous semiconductors; gallium compounds; indium compounds; invertors; lighting; stability; thin film transistors; wide band gap semiconductors; zinc compounds; InGaZnO; NBITS; depletion load; depletion mode load; enhancement mode driver; full-swing inverter; high-performance amorphous indium-gallium-zinc-oxide thin-film transistor inverter; light illumination; load TFT; negative bias direction; negative bias illumination temperature stress; negative bias instability; parallel shift; subthreshold slope; Indium gallium zinc oxide; Inverters; Lighting; Logic circuits; Stress; Thin film transistors; Amorphous indium–gallium–zinc–oxide (IGZO); depletion mode; inverter; negative bias illumination temperature stress (NBITS); thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2221454
  • Filename
    6353893