DocumentCode :
1335845
Title :
Shifting boundaries
Author :
Davies, D.
Author_Institution :
IET, Stevenage, UK
Volume :
48
Issue :
23
fYear :
2012
Firstpage :
1439
Lastpage :
1439
Abstract :
US researchers report new RF power limiters based on III-Nitride materials that have unprecedented high operating voltages, excellent temperature stability and radiation hardness. Fully planar and simple to fabricate, these limiters could be used in nearly any type of microwave integrated circuit.
Keywords :
microwave integrated circuits; microwave limiters; radiation hardening (electronics); III-nitride materials; RF power limiters; US researchers; microwave integrated circuit; radiation hardness; temperature stability;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2012.3759
Filename :
6354215
Link To Document :
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