• DocumentCode
    1335875
  • Title

    The Future of Integrated Circuits: A Survey of Nanoelectronics

  • Author

    Haselman, Michael ; Hauck, Scott

  • Author_Institution
    Electr. Eng. Dept., Univ. of Washington, Seattle, WA, USA
  • Volume
    98
  • Issue
    1
  • fYear
    2010
  • Firstpage
    11
  • Lastpage
    38
  • Abstract
    While most of the electronics industry is dependent on the ever-decreasing size of lithographic transistors, this scaling cannot continue indefinitely. Nanoelectronics (circuits built with components on the scale of 10 nm) seem to be the most promising successor to lithographic based ICs. Molecular-scale devices including diodes, bistable switches, carbon nanotubes, and nanowires have been fabricated and characterized in chemistry labs. Techniques for self-assembling these devices into different architectures have also been demonstrated and used to build small-scale prototypes. While these devices and assembly techniques will lead to nanoscale electronics, they also have the drawback of being prone to defects and transient faults. Fault-tolerance techniques will be crucial to the use of nanoelectronics. Lastly, changes to the software tools that support the fabrication and use of ICs will be needed to extend them to support nanoelectronics. This paper introduces nanoelectronics and reviews the current progress made in research in the areas of technologies, architectures, fault tolerance, and software tools.
  • Keywords
    integrated circuits; lithography; nanoelectronics; bistable switches; carbon nanotubes; diodes; electronics industry; fault tolerance techniques; integrated circuits; lithographic transistors; molecular-scale devices; nanoelectronics; nanoscale electronics; nanowires; size 10 nm; software tools; Carbon nanotubes; Circuits; Computer architecture; Diodes; Electronics industry; Fault tolerance; Nanoelectronics; Software tools; Switches; Transistors; Microassembly; nanotechnology; reconfigurable architectures; self-testing;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2009.2032356
  • Filename
    5337937