• DocumentCode
    1336014
  • Title

    RF power limiter using capacitively-coupled contacts III-nitride varactor

  • Author

    Jahan, F. ; Gaevski, M. ; Deng, Jiansong ; Gaska, R. ; Shur, M. ; Simin, G.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of South Carolina, Columbia, SC, USA
  • Volume
    48
  • Issue
    23
  • fYear
    2012
  • Firstpage
    1480
  • Lastpage
    1481
  • Abstract
    Reported is a low-loss RF power limiter built using a voltage-controlled capacitor formed by two planar Schottky contacts deposited over an AlGaN/GaN heterostructure. The symmetrical structure of the varactor enables dual-polarity voltage clamping. Small electrode size and electrode spacing of 2 μm ensures a low impedance and low loss. Varying the varactor width in the range 0.25 - 1 mm allows tuning of the limiting powers in the range 17 - 40 dBm, also dependent on the operating frequency. The small-signal loss at 10 GHz is 0.2 - 0.67 dB. The varactor structure fabrication does not require gate alignment or annealing; the device is robust and fully compatible with MMICs; it also provides the DC block with around 95 V breakdown. The PL operation in the temperature range 25 - 200°C without significant parameter degradation was demonstrated. Power limiter CW stress during 100 hat 24 dBm revealed no performance degradation.
  • Keywords
    III-V semiconductors; MMIC; Schottky barriers; aluminium compounds; gallium compounds; power dividers; varactors; wide band gap semiconductors; AlGaN-GaN; DC block; MMIC; annealing; capacitively-coupled contacts III-nitride varactor; dual-polarity voltage clamping; electrode spacing; frequency 10 GHz; gate alignment; loss 0.2 dB to 0.67 dB; low-loss RF power limiter; planar Schottky contacts; power limiter CW stress; size 0.25 mm to 1 mm; small electrode size; symmetrical structure; temperature 25 degC to 200 degC; varactor structure fabrication; voltage-controlled capacitor;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2012.3428
  • Filename
    6354240