Title :
Investigation of Waveguide Mode Profiles of AWGs Using a Low-Coherence Interferometric Method
Author :
Zhipeng Wang ; Yung-Jui Chen
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Univ. of Maryland, Baltimore, MD, USA
Abstract :
In this paper, we propose and demonstrate a novel method to characterize waveguide mode profiles in arrayed waveguide grating (AWG) devices by utilizing a low-coherence interferometric measurement. Our method calculates the waveguide mode profile from its far-field diffraction pattern obtained by the low-coherence interferometric measurement utilizing AWG as a testing vehicle. The waveguide mode profile and its far-field diffraction pattern follow the Fourier transformation relationship. Detailed formulation and analysis procedures are presented in this paper. Experimental results of waveguide mode profiles for Gaussian waveguides and multimode interference waveguides are also shown. This method is very effective in characterizing complex waveguide designs in advanced AWG devices.
Keywords :
Fourier transforms; Gaussian processes; arrayed waveguide gratings; light interferometry; Fourier transformation relationship; Gaussian waveguides; arrayed waveguide grating devices; far-field diffraction pattern; low-coherence interferometric measurement; multimode interference waveguides; waveguide mode profiles; Arrayed waveguide gratings; Interference; Optical diffraction; Optical filters; Optical interferometry; Optical ring resonators; Optical waveguides; Passband; Testing; Wavelength division multiplexing; Diffraction gratings; integrated optics devices; planar waveguides;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2009.2036140
