DocumentCode :
13362
Title :
Nano SNIS Junctions Fabricated by 3D FIB Sculpting for Application to Digital Electronics
Author :
Fretto, Matteo ; Enrico, E. ; De Leo, Natascia ; Boarino, Luca ; Rocci, Roberto ; Lacquaniti, Vincenzo
Author_Institution :
Ist. Naz. di Ricerca Metrol. (INRiM), Turin, Italy
Volume :
23
Issue :
3
fYear :
2013
fDate :
Jun-13
Firstpage :
1101104
Lastpage :
1101104
Abstract :
Overdamped Josephson junctions based on a Nb/Al-AlOx/Nb superconductor-normal metal-insulator-superconductor structure were realized at the submicrometer scale by using focused ion beam nano-sculpting technique. This approach represents an alternative solution to the classical electron beam lithography and allows for an accurate control of the junction dimensions. Superconductor-normal metal-insulator-superconductor structured junctions were downscaled to about 300 × 300 nm2 and electrically measured at 4.2 K. The simple fabrication process, leading to high current density, Jc, and characteristic voltage, Vc, values and good uniformity, makes these junctions promising as elementary cell in complex circuits for rapid single flux quantum and ac voltage standard applications.
Keywords :
Josephson effect; current density; focused ion beam technology; nanofabrication; nanostructured materials; superconducting junction devices; 3D focused ion beam sculpting; Nb-Al-AlOx-Nb; ac voltage standard application; characteristic voltage; complex circuits; current density; digital electronics; electrical measurement; elementary cell; fabrication process; focused ion beam nanosculpting technique; junction dimension control; nanosuperconductor-normal metal-insulator-superconductor junctions; overdamped Josephson junctions; rapid single flux quantum application; submicrometer scale; superconductor-normal metal-insulator-superconductor structured junctions; temperature 4.2 K; Etching; Fabrication; Ion beams; Josephson junctions; Junctions; Niobium; Focused ion beam (FIB); rapid single flux quantum (RSFQ) technology; submicron dimension; superconductor—normal metal—insulator—superconductor (SNIS) Josephson junction; voltage metrology;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2013.2240759
Filename :
6413177
Link To Document :
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