Title :
System complexity and integrated diagnostics
Author :
Simpson, William R. ; Sheppard, John W.
Author_Institution :
Arinc Res. Corp., Annapolis, MD, USA
Abstract :
An overview of a complete approach to integrated diagnostics is given. The approach is centered around an information-flow model and incorporates techniques from information fusion and artificial intelligence to guide analyses. The concept of integrated diagnosis is explained, and the model is examined. The authors show how to analyze testability, evaluate fault diagnosis, and create maintenance aids.<>
Keywords :
artificial intelligence; computer maintenance; computer testing; fault location; artificial intelligence; fault diagnosis; information fusion; information-flow model; integrated diagnostics; maintenance aids; system complexity; testability; Airplanes; Automatic testing; Failure analysis; Fault diagnosis; Fault tolerant systems; Government; Life testing; Manufacturing processes; NP-complete problem; System testing;
Journal_Title :
Design & Test of Computers, IEEE
